InGaN quantum well epilayers morphological evolution under a wide range of MOCVD growth parameter sets
D. I. Florescu, S. M. Ting, V. N. Merai, A. Parekh, D. S. Lee, E.A. Armour, W. E. QuinnVolume:
3
Year:
2006
Language:
english
Pages:
4
DOI:
10.1002/pssc.200565159
File:
PDF, 521 KB
english, 2006