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Characterization of structural defects in (110) GaN films grown on (102) sapphire substrates
P. Vennéguès, F. Mathal, Z. BougriouaVolume:
3
Year:
2006
Language:
english
Pages:
4
DOI:
10.1002/pssc.200565292
File:
PDF, 448 KB
english, 2006