Investigation of defects in GaN with varying Mg doping...

Investigation of defects in GaN with varying Mg doping concentrations

Toshiyuki Obata, Naoki Matsumura, Kiyoshi Ogiwara, Hideki Hirayama, Yoshinobu Aoyagi, Koji Ishibashi
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Volume:
3
Year:
2006
Language:
english
Pages:
4
DOI:
10.1002/pssc.200565340
File:
PDF, 171 KB
english, 2006
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