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Local structural characterization of epitaxial a -plane InGaN/GaN thin films by transmission electron microscopy
T. Yamazaki, K. Kusakabe, N. Nakanishi, K. Ohkawa, I. HashimotoVolume:
3
Year:
2006
Language:
english
Pages:
4
DOI:
10.1002/pssc.200565468
File:
PDF, 173 KB
english, 2006