Structural and electrical studies of partial dislocations and stacking faults in (11-20)-oriented 4H-SiC
L. Ottaviani, H. Idrissi, P. Hidalgo, M. Lancin, B. PichaudVolume:
2
Year:
2005
Pages:
1
DOI:
10.1002/pssc.200590005
File:
PDF, 339 KB
2005