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Investigation of defects in organic semiconductors by charge based Deep Level Transient Spectroscopy (Q-DLTS)
T. P. Nguyen, C. Renaud, P. Le Rendu, S. H. YangVolume:
6
Year:
2009
Language:
english
Pages:
6
DOI:
10.1002/pssc.200881458
File:
PDF, 366 KB
english, 2009