Reliability of InGaN-based LEDs submitted to reverse-bias...

Reliability of InGaN-based LEDs submitted to reverse-bias stress

Matteo Meneghini, Nicola Trivellin, Rainer Butendeich, Ulrich Zehnder, Berthold Hahn, Gaudenzio Meneghesso, Enrico Zanoni
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Volume:
7
Year:
2010
Language:
english
Pages:
3
DOI:
10.1002/pssc.200983535
File:
PDF, 133 KB
english, 2010
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