Valence band structure of III-V nitride films characterized by hard X-ray photoelectron spectroscopy
M. Sumiya, M. Lozach, N. Matsuki, S. Ito, N. Ohhashi, K. Sakoda, H. Yoshikawa, S. Ueda, K. KobayashiVolume:
7
Year:
2010
Language:
english
Pages:
3
DOI:
10.1002/pssc.200983596
File:
PDF, 413 KB
english, 2010