An XPS analysis of different SiO2 modifications employing a...

Surface and Interface Analysis 1992 Vol. 18; Iss. 1

An XPS analysis of different SiO2 modifications employing a C 1s as well as an Au 4f7/2 static charge reference

Th. Gross, M. Ramm, H. Sonntag, W. Unger, H. M. Weijers, E. H. Adem
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
18
Year:
1992
Language:
english
Pages:
6
DOI:
10.1002/sia.740180110
File:
PDF, 535 KB
english, 1992
Conversion to is in progress
Conversion to is failed