Volume 18; Issue 1

Surface and Interface Analysis

Volume 18; Issue 1

1

Masthead

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 90 KB

english, 1992

2

Editorial

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 44 KB

english, 1992

3

Quantitative Auger electron spectroscopy of silicides by extended matrix correction using dN(E)/dE spectra

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 974 KB

english, 1992

4

An investigation of the surface chemistry of poly(ether etherketone). I. The effect of oxygen plasma treatment on surface structure

D. J. Pawson, A. P. Ameen, R. D. Short, P. Denison, F. R. Jones

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 971 KB

english, 1992

5

Characterization of interfaces in ceramic composites by SIMS, AES and EPMA

S. Mischler, H. E. Bishop, J. J. R. Davies

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 965 KB

english, 1992

6

Optical ellipsometry and electron spectroscopy studies of copper oxidation related to copper on printed circuit boards

A. Manara, V. Sirtori, L. Mammarella

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 751 KB

english, 1992

7

X-ray photoelectron spectroscopy analysis of copper and zinc oxides and sulphides

G. Deroubaix, P. Marcus

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 634 KB

english, 1992

8

Estimates of peak areas and relative atomic amounts from wide-scan XPS spectra

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 474 KB

english, 1992

9

Depth profile analysis of aluminium metallization in microelectronics: Optimization of depth resolution

W. Pamler, K. Wangemann

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 754 KB

english, 1992

10

An XPS analysis of different SiO2 modifications employing a C 1s as well as an Au 4f7/2 static charge reference

Th. Gross, M. Ramm, H. Sonntag, W. Unger, H. M. Weijers, E. H. Adem

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 535 KB

english, 1992

11

Probing depth of soft x-ray absorption spectroscopy measured in total-electron-yield mode

M. Abbate, J. B. Goedkoop, F. M. F. de Groot, M. Grioni, J. C. Fuggle, S. Hofmann, H. Petersen, M. Sacchi

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 549 KB

english, 1992

12

Optical second harmonic generation in reflection from silicon carbide films

A. Galeckas, M. Petrauskas, M. Willander, Q. Wahab

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 194 KB

english, 1992

13

Forthcoming events

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 86 KB

english, 1992

14

Recently accepted papers

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 103 KB

english, 1992

15

Colour illustrations in SIA

Journal:

Surface and Interface Analysis

Year:

1992

File:

PDF, 28 KB

1992

16

Product news

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 62 KB

english, 1992