Probing depth of soft x-ray absorption spectroscopy...

Surface and Interface Analysis 1992 Vol. 18; Iss. 1

Probing depth of soft x-ray absorption spectroscopy measured in total-electron-yield mode

M. Abbate, J. B. Goedkoop, F. M. F. de Groot, M. Grioni, J. C. Fuggle, S. Hofmann, H. Petersen, M. Sacchi
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Volume:
18
Year:
1992
Language:
english
Pages:
5
DOI:
10.1002/sia.740180111
File:
PDF, 549 KB
english, 1992
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