Technique for XPS measurements of volatile adsorbed layers: Application to studies of sulphide flotation
I. Kartio, K. Laajalehto, E. Suoninen, S. Karthe, R. SzarganVolume:
18
Year:
1992
Language:
english
Pages:
4
DOI:
10.1002/sia.740181205
File:
PDF, 428 KB
english, 1992