Electrical and optical characterization of extended defects...

Electrical and optical characterization of extended defects induced in p-type Si after Si ion implantation

Nyamhere, Cloud, Cristiano, Fuccio, Olivie, Francios, Bedel-Pereira, Elena, Essa, Zahi
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Volume:
11
Language:
english
Journal:
physica status solidi (c)
DOI:
10.1002/pssc.201300204
Date:
January, 2014
File:
PDF, 353 KB
english, 2014
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