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Electrical and optical characterization of extended defects induced in p-type Si after Si ion implantation
Nyamhere, Cloud, Cristiano, Fuccio, Olivie, Francios, Bedel-Pereira, Elena, Essa, ZahiVolume:
11
Language:
english
Journal:
physica status solidi (c)
DOI:
10.1002/pssc.201300204
Date:
January, 2014
File:
PDF, 353 KB
english, 2014