Surface topography analysis with application of roughness area dependence method
Szyszka, Adam, Wośko, Mateusz, Szymański, Tomasz, Paszkiewicz, ReginaVolume:
170
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2016.07.017
Date:
November, 2016
File:
PDF, 1.55 MB
english, 2016