Volume 170

Ultramicroscopy

Volume 170

1

Comprehensive analysis of TEM methods for LiFePO4/FePO4 phase mapping: spectroscopic techniques (EFTEM, STEM-EELS) and STEM diffraction techniques (ACOM-TEM)

Mu, X., Kobler, A., Wang, D., Chakravadhanula, V.S.K., Schlabach, S., Szabó, D.V., Norby, P., Kübel, C.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 1.27 MB

english, 2016

2

Dose-rate-dependent damage of cerium dioxide in the scanning transmission electron microscope

Johnston-Peck, Aaron C., DuChene, Joseph S., Roberts, Alan D., Wei, Wei David, Herzing, Andrew A.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 2.26 MB

english, 2016

3

Observation of electron beam moiré fringes in an image conversion tube

Lei, Yunfei, Liao, Yubo, Long, Jing-hua, Cai, Houzhi, Bai, Yanli, Liu, Jinyuan

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 955 KB

english, 2016

4

When does atomic resolution plan view imaging of surfaces work?

Koirala, Pratik, Lin, Yuyuan, Ciston, Jim, Marks, Laurence D.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 997 KB

english, 2016

5

Adaptive multiresolution method for MAP reconstruction in electron tomography

Acar, Erman, Peltonen, Sari, Ruotsalainen, Ulla

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 1.81 MB

english, 2016

6

Progress in structure recovery from low dose exposures: Mixed molecular adsorption, exploitation of symmetry and reconstruction from the minimum signal level

Kramberger, C., Meyer, J.C.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 1.07 MB

english, 2016

7

Surface topography analysis with application of roughness area dependence method

Szyszka, Adam, Wośko, Mateusz, Szymański, Tomasz, Paszkiewicz, Regina

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 1.55 MB

english, 2016

8

Current status and future directions for in situ transmission electron microscopy

Taheri, Mitra L., Stach, Eric A., Arslan, Ilke, Crozier, P.A., Kabius, Bernd C., LaGrange, Thomas, Minor, Andrew M., Takeda, Seiji, Tanase, Mihaela, Wagner, Jakob B., Sharma, Renu

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 1.33 MB

english, 2016

9

Accurate measurement of absolute experimental inelastic mean free paths and EELS differential cross-sections

Craven, Alan J., Bobynko, Joanna, Sala, Bianca, MacLaren, Ian

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 1.25 MB

english, 2016

10

Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design

Gonnissen, J., De Backer, A., den Dekker, A.J., Sijbers, J., Van Aert, S.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 1.44 MB

english, 2016

11

Linear chemically sensitive electron tomography using DualEELS and dictionary-based compressed sensing

AlAfeef, Ala, Bobynko, Joanna, Cockshott, W. Paul., Craven, Alan J., Zuazo, Ian, Barges, Patrick, MacLaren, Ian

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 1.36 MB

english, 2016

12

Sparse modeling of EELS and EDX spectral imaging data by nonnegative matrix factorization

Shiga, Motoki, Tatsumi, Kazuyoshi, Muto, Shunsuke, Tsuda, Koji, Yamamoto, Yuta, Mori, Toshiyuki, Tanji, Takayoshi

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 2.94 MB

english, 2016

13

High temperature conductance mapping for correlation of electrical properties with micron-sized chemical and microstructural features

Hansen, Karin Vels, Norrman, Kion, Jacobsen, Torben

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 1.54 MB

english, 2016

14

Cross-sectional measurement of grain boundary segregation using WDS

Christien, F., Risch, P.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 512 KB

english, 2016

15

IFC (Editorial Board)

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 79 KB

english, 2016