Transient Thermoreflectance for Gate Temperature Assessment...

IEEE Electron Device Letters 2016 / 9 Vol. 37; Iss. 9

Transient Thermoreflectance for Gate Temperature Assessment in Pulse Operated GaN-Based HEMTs

Martin-Horcajo, Sara, Pomeroy, James W., Lambert, Benoit, Jung, Helmut, Blanck, Herve, Kuball, Martin
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Volume:
37
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2016.2595400
Date:
September, 2016
File:
PDF, 1.27 MB
english, 2016
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