Sparse modeling of EELS and EDX spectral imaging data by...

Ultramicroscopy 2016 / 11 Vol. 170

Sparse modeling of EELS and EDX spectral imaging data by nonnegative matrix factorization

Shiga, Motoki, Tatsumi, Kazuyoshi, Muto, Shunsuke, Tsuda, Koji, Yamamoto, Yuta, Mori, Toshiyuki, Tanji, Takayoshi
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Volume:
170
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2016.08.006
Date:
November, 2016
File:
PDF, 2.94 MB
english, 2016
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