MOS-DEGRADATION IN INPUT AND OUTPUT STAGES OF...

MOS-DEGRADATION IN INPUT AND OUTPUT STAGES OF VLSI-CMOS-CIRCUITS DUE TO ELECTROSTATIC DISCHARGE

GUGGENMOS, X.
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Volume:
49
Language:
english
Journal:
Le Journal de Physique Colloques
DOI:
10.1051/jphyscol:1988463
Date:
September, 1988
File:
PDF, 1.12 MB
english, 1988
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