Observation of temperature effect on electrical properties...

Microelectronic Engineering 2017 / 01 Vol. 168

Observation of temperature effect on electrical properties of novel Au/Bi0.7Dy0.3FeO3/ZnO/p-Si thin film MIS capacitor for MEMS applications

Bhatia, Deepak, Roy, Sandipta, Nawaz, S., Meena, R.S., Palkar, V.R.
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Volume:
168
Language:
english
Journal:
Microelectronic Engineering
DOI:
10.1016/j.mee.2016.11.001
Date:
January, 2017
File:
PDF, 2.02 MB
english, 2017
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