Characteristics of ESD protection devices operated under elevated temperatures
Liang, Wei, Dong, Aihua, Li, Hang, Miao, Meng, Kuo, Chung-Chen, Klebanov, Maxim, Liou, Juin J.Volume:
66
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2016.10.008
Date:
November, 2016
File:
PDF, 2.05 MB
english, 2016