Modifying the Ni-MoS 2 Contact...

IEEE Electron Device Letters 2016 / 9 Vol. 37; Iss. 9

Modifying the Ni-MoS 2 Contact Interface Using a Broad-Beam Ion Source

Cheng, Zhihui, Cardenas, Jorge A., McGuire, Felicia, Najmaei, Sina, Franklin, Aaron D.
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Volume:
37
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2016.2591552
Date:
September, 2016
File:
PDF, 598 KB
english, 2016
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