![](/img/cover-not-exists.png)
Evaluation of the Outgassing from Resists at the EUV Wavelength.
Irie, Shigeo, Oizumi, Hiroaki, Nishiyama, Iwao, Shirayone, Shigeru, Ryoo, Manhyoung, Yamanashi, Hiromasa, Yano, Ei, Okazaki, ShinjiVolume:
14
Year:
2001
Language:
english
Journal:
Journal of Photopolymer Science and Technology
DOI:
10.2494/photopolymer.14.561
File:
PDF, 666 KB
english, 2001