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Comparison of convergent beam electron diffraction and annular bright field atomic imaging for GaN polarity determination
Roshko, Alexana, Brubaker, Matt D., Blanchard, Paul T., Bertness, Kris A., Harvey, Todd E., Geiss, Roy H., Levin, IgorVolume:
32
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/jmr.2016.443
Date:
March, 2017
File:
PDF, 713 KB
english, 2017