Volume 32; Issue 5

Journal of Materials Research

Volume 32; Issue 5

1

Study of phase separation in an InGaN alloy by electron energy loss spectroscopy in an aberration corrected monochromated scanning transmission electron microscope

Walther, Thomas, Wang, Xiaoyi, Angadi, Veerendra C., Ruterana, Pierre, Longo, Paolo, Aoki, Toshihiro

Journal:

Journal of Materials Research

Year:

2017

Language:

english

File:

PDF, 1011 KB

english, 2017

2

Comparison of convergent beam electron diffraction and annular bright field atomic imaging for GaN polarity determination

Roshko, Alexana, Brubaker, Matt D., Blanchard, Paul T., Bertness, Kris A., Harvey, Todd E., Geiss, Roy H., Levin, Igor

Journal:

Journal of Materials Research

Year:

2017

Language:

english

File:

PDF, 713 KB

english, 2017

3

New insights on ion track morphology in pyrochlores by aberration corrected scanning transmission electron microscopy

Sachan, Ritesh, Zhang, Yanwen, Ou, Xin, Trautmann, Christina, Chisholm, Matthew F., Weber, William J.

Journal:

Journal of Materials Research

Year:

2017

Language:

english

File:

PDF, 650 KB

english, 2017

4

Aberration-corrected self-interference of split higher order Laue zone line for measuring the z-dependent strain profile

Norouzpour, Mana, Herring, Rodney

Journal:

Journal of Materials Research

Year:

2017

Language:

english

File:

PDF, 664 KB

english, 2017

5

Observation of compound semiconductors and heterovalent interfaces using aberration-corrected scanning transmission electron microscopy

Smith, David J., Lu, Jing, Aoki, Toshihiro, McCartney, Martha R., Zhang, Yong-Hang

Journal:

Journal of Materials Research

Year:

2017

Language:

english

File:

PDF, 556 KB

english, 2017

6

Recent studies of oxide-semiconductor heterostructures using aberration-corrected scanning transmission electron microscopy

Smith, David J., Wu, HsinWei, Lu, Sirong, Aoki, Toshihiro, Ponath, Patrick, Fredrickson, Kurt, McDaniel, Martin D., Lin, Edward, Posadas, Agham B., Demkov, Alexander A., Ekerdt, John, McCartney, Marth

Journal:

Journal of Materials Research

Year:

2017

Language:

english

File:

PDF, 877 KB

english, 2017

7

Introduction

Walther, Thomas, Dunin-Borkowski, Rafal E., Rouvière, Jean-Luc, Stach, Eric A.

Journal:

Journal of Materials Research

Year:

2017

Language:

english

File:

PDF, 40 KB

english, 2017

8

An effect of crystal tilt on the determination of ions displacements in perovskite oxides under BF/HAADF-STEM imaging mode

Liu, Y., Zhu, Y.L., Tang, Y.L., Ma, X.L.

Journal:

Journal of Materials Research

Year:

2017

Language:

english

File:

PDF, 791 KB

english, 2017

9

JMR volume 32 issue 5 Cover and Back matter

Journal:

Journal of Materials Research

Year:

2017

Language:

english

File:

PDF, 1.70 MB

english, 2017

10

Beam-induced atomic migration at Ag-containing nanofacets at an asymmetric Cu grain boundary

Peter, Nicolas J., Liebscher, Christian H., Kirchlechner, Christoph, Dehm, Gerhard

Journal:

Journal of Materials Research

Year:

2017

Language:

english

File:

PDF, 936 KB

english, 2017

11

JMR volume 32 issue 5 Cover and Front matter

Journal:

Journal of Materials Research

Year:

2017

Language:

english

File:

PDF, 692 KB

english, 2017

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