Analytical Modeling and TCAD Simulation of a Quanta Image...

IEEE Journal of the Electron Devices Society 2017 / 1 Vol. 5; Iss. 1

Analytical Modeling and TCAD Simulation of a Quanta Image Sensor Jot Device With a JFET Source-Follower for Deep Sub-Electron Read Noise

Ma, Jiaju, Fossum, Eric R.
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Volume:
5
Language:
english
Journal:
IEEE Journal of the Electron Devices Society
DOI:
10.1109/jeds.2016.2618721
Date:
January, 2017
File:
PDF, 1.49 MB
english, 2017
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