Image Analysis of Whole Grains: A Noninvasive Method to...

Cereal Chemistry 2001 / 05 Vol. 78; Iss. 3

Image Analysis of Whole Grains: A Noninvasive Method to Predict Semolina Yield in Durum Wheat

Novaro, P., Colucci, F., Venora, G., D'Egidio, M. G.
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Volume:
78
Language:
english
Journal:
Cereal Chemistry Journal
DOI:
10.1094/CCHEM.2001.78.3.217
Date:
May, 2001
File:
PDF, 110 KB
english, 2001
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