![](/img/cover-not-exists.png)
Image Analysis of Whole Grains: A Noninvasive Method to Predict Semolina Yield in Durum Wheat
Novaro, P., Colucci, F., Venora, G., D'Egidio, M. G.Volume:
78
Language:
english
Journal:
Cereal Chemistry Journal
DOI:
10.1094/CCHEM.2001.78.3.217
Date:
May, 2001
File:
PDF, 110 KB
english, 2001