Design and implementation of a micron-sized electron column fabricated by focused ion beam milling
Wicki, Flavio, Longchamp, Jean-Nicolas, Escher, Conrad, Fink, Hans-WernerVolume:
160
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2015.09.013
Date:
January, 2016
File:
PDF, 2.27 MB
english, 2016