Single Defect Discharge Events in Vertical-Nanowire...

IEEE Transactions on Device and Materials Reliability 2017 / 3 Vol. 17; Iss. 1

Single Defect Discharge Events in Vertical-Nanowire Tunnel-FETs

Fiore, Antonio, Franco, Jacopo, Cho, Moonju, Crupi, Felice, Strangio, Sebastiano, Roussel, Philippe J., Rooyackers, Rita, Collaert, Nadine, Linten, Dimitri
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Volume:
17
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2017.2655623
Date:
March, 2017
File:
PDF, 1.18 MB
english, 2017
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