IEEE Transactions on Device and Materials Reliability

1

Soft Errors Induced by High-Energy Electrons

Gadlage, Matthew J., Roach, Austin H., Duncan, Adam R., Williams, Aaron M., Bossev, Dobrin P., Kay, Matthew J.

Journal:

Year:

2017

Language:

english

File:

PDF, 824 KB

english, 2017

2

A Long Duration Transient Resilient Pipeline Scheme

Koser, Erol, Stechele, Walter

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 1.85 MB

english, 2017

3

Mechanism of Depletion-Mode TDDB for 4H-SiC MOS Structure

Watanabe, Tomokatsu, Hino, Shiro, Iwamatsu, Toshiaki, Tomohisa, Shingo, Yamakawa, Satoshi

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 2.02 MB

english, 2017

4

A Multichip Phase-Leg IGBT Module Bonded by Pressureless Sintering of Nanosilver Paste

Fu, Shancan, Mei, Yunhui, Li, Xin, Ma, Changsheng, Lu, Guo-Quan

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 2.06 MB

english, 2017

5

An Agile Post-Silicon Validation Methodology for the Address Translation Mechanisms of Modern Microprocessors

Papadimitriou, George, Chatzidimitriou, Athanasios, Gizopoulos, Dimitris, Morad, Ronny

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 590 KB

english, 2017

6

Ultra-Low Power, Highly Reliable, and Nonvolatile Hybrid MTJ/CMOS Based Full-Adder for Future VLSI Design

Rajaei, Ramin, Bakhtavari Mamaghani, Sina

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 833 KB

english, 2017

7

Failure of High Power LEDs Submitted to EOS: Dependence on Device Layout and Pulse Properties

Buffolo, Matteo, Meneghini, Matteo, Munaretto, Andrea, De Santi, Carlo, Meneghesso, Gaudenzio, Zanoni, Enrico

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 1.15 MB

english, 2017

8

Improved Performance and Heat Dissipation of Flip-Chip White High-Voltage Light Emitting Diodes

Wu, Ping-Chen, Ou, Sin-Liang, Horng, Ray-Hua, Wuu, Dong-Sing

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 654 KB

english, 2017

9

A 2.5 GHz Low Power, High- ${Q}$ , Reliable Design of Active Bandpass Filter

Kumar, Vikash, Mehra, Rishab, Islam, Aminul

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 1.13 MB

english, 2017

10

Fast-Pulsed Characterizations of RF GaN HEMTs During Wearout

Paine, Bruce M., Polmanter, Steve R., Ng, Vincent T., Kubota, Neil T., Ignacio, Carl R.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 700 KB

english, 2017

11

Buckling and Postbuckling Failure Analyses on a Rectangular Membrane for Touch Panel Applications

Chuang, Chang-Hsin, Chang, Yu-Kai, Chen, Kuo-Shen, Chen, Chun-Chih

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 907 KB

english, 2017

12

Compact Modeling of Dynamic MOSFET Degradation Due to Hot-Electrons

Tanoue, H., Tanaka, A., Oodate, Y., Nakahagi, T., Sugiyama, D., Ma, C., Mattausch, H. J., Miura-Mattausch, M.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 1.33 MB

english, 2017

13

Effect of Microstructure and Anisotropy of Copper on Reliability in Nanoscale Interconnects

Basavalingappa, Adarsh, Lloyd, James R.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 1.66 MB

english, 2017

14

Charge Trapping Analysis of Metal/Al 2 O 3 /SiO 2 /Si, Gate Stack for Emerging Embedded Memories

Khosla, Robin, Rolseth, Erlend Granbo, Kumar, Pawan, Vadakupudhupalayam, Senthil Srinivasan, Sharma, Satinder K., Schulze, Jorg

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 1.81 MB

english, 2017

15

Single Defect Discharge Events in Vertical-Nanowire Tunnel-FETs

Fiore, Antonio, Franco, Jacopo, Cho, Moonju, Crupi, Felice, Strangio, Sebastiano, Roussel, Philippe J., Rooyackers, Rita, Collaert, Nadine, Linten, Dimitri

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 1.18 MB

english, 2017

16

Aging Assessment and Design Enhancement of Randomized Cache Memories

Trilla, David, Hernandez, Carles, Abella, Jaume, Cazorla, Francisco J.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 617 KB

english, 2017

17

Statistical Analysis and Comparison of 2T and 3T1D e-DRAM Minimum Energy Operation

Rana, Manish, Canal, Ramon, Amat, Esteve, Rubio, Antonio

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 13.05 MB

english, 2017

18

Impact of Interface Trap Charges on Performance of Electrically Doped Tunnel FET With Heterogeneous Gate Dielectric

Venkatesh, Pulimamidi, Nigam, Kaushal, Pandey, Sunil, Sharma, Dheeraj, Kondekar, Pravin N.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 2.52 MB

english, 2017

19

Failure Analysis and Improvement for High Power Single-Phase Module

Wei, Jiaxing, Liu, Siyang, Sun, Weifeng, Zhang, Chunwei, Wang, Ning, Si, Kaixin, Song, Haiyang, Zhu, Jiutao, Yu, Chuanwu, Ye, Peng, Zhu, Yuanzheng

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 867 KB

english, 2017

20

Experimental Investigation of NBTI Degradation in Power VDMOS Transistors Under Low Magnetic Field

Tahi, Hakim, Tahanout, Cherifa, Boubaaya, Mohamed, Djezzar, Boualem, Merah, Sidi Mohammed, Nadji, Bacharia, Saoula, Nadia

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 1.06 MB

english, 2017

21

Estimating Traveling Wave Tubes (TWTs) Failure Rate Using Bayesian Posterior Analysis From Spacecraft On-Orbit Flight Data

Huang, Wei, Loman, James, Andrada, Roy, Ortland, Randall

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 346 KB

english, 2017

22

Design and Evaluation of an Efficient Schmitt Trigger-Based Hardened Latch in CNTFET Technology

Moghaddam, Majid, Moaiyeri, Mohammad Hossein, Eshghi, Mohammad

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 1.46 MB

english, 2017

23

High-Yield and Robust 9T SRAM Cell Tolerant to Removal of Metallic Carbon Nanotubes

Sun, Yanan, He, Weifeng, Mao, Zhigang, Jiao, Hailong, Kursun, Volkan

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 647 KB

english, 2017

24

Boosting the SOI MOSFET Electrical Performance by Using the Octagonal Layout Style in High Temperature Environment

Galembeck, Egon Henrique Salerno, Renaux, Christian, Flandre, Denis, Finco, Saulo, Gimenez, Salvador Pinillos

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 815 KB

english, 2017

25

Impact of X-Ray Tomography on the Reliability of Integrated Circuits

Alam, Mahbub, Shen, Haoting, Asadizanjani, Navid, Tehranipoor, Mark, Forte, Domenic

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 791 KB

english, 2017

26

An Effective Approach of Improving Electrical and Thermo-Mechanical Reliabilities of Through-Silicon Vias

Wang, Fengjuan, Yu, Ningmei

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 1.75 MB

english, 2017

27

ESD Self-Protection of High-Speed Transceivers Using Adaptive Active Bias Conditioning

Keel, Min-Sun, Rosenbaum, Elyse

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 1.68 MB

english, 2017

28

Soft-Failures Induced by System-Level ESD

Thomson, Nicholas A., Xiu, Yang, Rosenbaum, Elyse

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 1.43 MB

english, 2017

29

Foreword to the Special Section on the IEEE International On-Line Testing and Robust System Design Symposium (IOLTS) 2016

Gizopoulos, Dimitris, Alexandrescu, Dan, Nicolaidis, Michael

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 72 KB

english, 2017

30