The Lucky Electron Model for TDDB in Low-k Dielectrics

IEEE Transactions on Device and Materials Reliability 2016 / 12 Vol. 16; Iss. 4

The Lucky Electron Model for TDDB in Low-k Dielectrics

Lloyd, J. R.
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Volume:
16
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2016.2619071
Date:
December, 2016
File:
PDF, 148 KB
english, 2016
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