![](/img/cover-not-exists.png)
Observation of compound semiconductors and heterovalent interfaces using aberration-corrected scanning transmission electron microscopy
Smith, David J., Lu, Jing, Aoki, Toshihiro, McCartney, Martha R., Zhang, Yong-HangVolume:
32
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/jmr.2016.297
Date:
March, 2017
File:
PDF, 556 KB
english, 2017