Quantitative AC - Kelvin Probe Force Microscopy

Microelectronic Engineering 2017 / 05 Vol. 176

Quantitative AC - Kelvin Probe Force Microscopy

Kohl, Dominik, Mesquida, Patrick, Schitter, Georg
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Volume:
176
Language:
english
Journal:
Microelectronic Engineering
DOI:
10.1016/j.mee.2017.01.005
Date:
May, 2017
File:
PDF, 894 KB
english, 2017
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