Empirical model predicting the layer thickness and porosity of p-type mesoporous silicon
Wolter, Sascha J, Geisler, Dennis, Hensen, Jan, Köntges, Marc, Kajari-Schröder, Sarah, Bahnemann, Detlef W, Brendel, RolfVolume:
32
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/1361-6641/aa5bb7
Date:
April, 2017
File:
PDF, 639 KB
english, 2017