Impact of X-Ray Tomography on the Reliability of Integrated...

IEEE Transactions on Device and Materials Reliability 2017 / 3 Vol. 17; Iss. 1

Impact of X-Ray Tomography on the Reliability of Integrated Circuits

Alam, Mahbub, Shen, Haoting, Asadizanjani, Navid, Tehranipoor, Mark, Forte, Domenic
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Volume:
17
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2017.2656839
Date:
March, 2017
File:
PDF, 791 KB
english, 2017
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