Recent studies of oxide-semiconductor heterostructures using aberration-corrected scanning transmission electron microscopy
Smith, David J., Wu, HsinWei, Lu, Sirong, Aoki, Toshihiro, Ponath, Patrick, Fredrickson, Kurt, McDaniel, Martin D., Lin, Edward, Posadas, Agham B., Demkov, Alexander A., Ekerdt, John, McCartney, MarthVolume:
32
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/jmr.2016.273
Date:
March, 2017
File:
PDF, 877 KB
english, 2017