High Voltage Stress Induced in Transparent Polycrystalline...

IEEE Electron Device Letters 2017 / 5 Vol. 38; Iss. 5

High Voltage Stress Induced in Transparent Polycrystalline Diamond Field-Effect Transistor and Enhanced Endurance Using Thick Al 2 O 3 Passivation Layer

Syamsul, Mohd, Kitabayashi, Yuya, Kudo, Takuya, Matsumura, Daisuke, Kawarada, Hiroshi
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Volume:
38
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2017.2685081
Date:
May, 2017
File:
PDF, 1.19 MB
english, 2017
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