ESD Robust Fully Salicided 5-V Integrated Power MOSFET in...

IEEE Electron Device Letters 2017 / 5 Vol. 38; Iss. 5

ESD Robust Fully Salicided 5-V Integrated Power MOSFET in Submicron CMOS

Lee, Jian-Hsing, Iyer, Natarajan Mahadeva, Prabhu, Manjunatha
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Volume:
38
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2017.2686638
Date:
May, 2017
File:
PDF, 983 KB
english, 2017
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