Current-Voltage Model for Negative Capacitance Field-Effect...

IEEE Electron Device Letters 2017 / 5 Vol. 38; Iss. 5

Current-Voltage Model for Negative Capacitance Field-Effect Transistors

Lee, Hyunjae, Yoon, Youngki, Shin, Changhwan
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Volume:
38
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2017.2679102
Date:
May, 2017
File:
PDF, 795 KB
english, 2017
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