Optimising multi-frame ADF-STEM for high-precision...

Ultramicroscopy 2017 / 08 Vol. 179

Optimising multi-frame ADF-STEM for high-precision atomic-resolution strain mapping

Jones, Lewys, Wenner, Sigurd, Nord, Magnus, Ninive, Per Harald, Løvvik, Ole Martin, Holmestad, Randi, Nellist, Peter D.
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Volume:
179
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2017.04.007
Date:
August, 2017
File:
PDF, 2.00 MB
english, 2017
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