Volume 179

Ultramicroscopy

Volume 179

1

EMCD with an electron vortex filter: Limitations and possibilities

Schachinger, T., Löffler, S., Steiger-Thirsfeld, A., Stöger-Pollach, M., Schneider, S., Pohl, D., Rellinghaus, B., Schattschneider, P.

Journal:

Ultramicroscopy

Year:

2017

Language:

english

File:

PDF, 2.18 MB

english, 2017

2

Super-resolved 3-D imaging of live cells’ organelles from bright-field photon transmission micrographs

Rychtáriková, Renata, Náhlík, Tomáš, Shi, Kevin, Malakhova, Daria, Macháček, Petr, Smaha, Rebecca, Urban, Jan, Štys, Dalibor

Journal:

Ultramicroscopy

Year:

2017

Language:

english

File:

PDF, 2.83 MB

english, 2017

3

Focused ion beam-assisted fabrication of soft high-aspect ratio silicon nanowire atomic force microscopy probes

Knittel, Peter, Hibst, Nicolas, Mizaikoff, Boris, Strehle, Steffen, Kranz, Christine

Journal:

Ultramicroscopy

Year:

2017

Language:

english

File:

PDF, 621 KB

english, 2017

4

Switchable bi-stable multilayer magnetic probes for imaging of soft magnetic structures

Wren, Tom, Puttock, Robb, Gribkov, Boris, Vdovichev, Sergey, Kazakova, Olga

Journal:

Ultramicroscopy

Year:

2017

Language:

english

File:

PDF, 1.25 MB

english, 2017

5

Compressed sensing for STEM tomography

Donati, Laurène, Nilchian, Masih, Trépout, Sylvain, Messaoudi, Cédric, Marco, Sergio, Unser, Michael

Journal:

Ultramicroscopy

Year:

2017

Language:

english

File:

PDF, 5.82 MB

english, 2017

6

On the role of the second-order derivative term in the calculation of convergent beam diffraction patterns

Hillier, S.C., Robertson, E.T., Reid, G.D., Haynes, R.D., Robertson, M.D.

Journal:

Ultramicroscopy

Year:

2017

Language:

english

File:

PDF, 1.03 MB

english, 2017

7

Optimising multi-frame ADF-STEM for high-precision atomic-resolution strain mapping

Jones, Lewys, Wenner, Sigurd, Nord, Magnus, Ninive, Per Harald, Løvvik, Ole Martin, Holmestad, Randi, Nellist, Peter D.

Journal:

Ultramicroscopy

Year:

2017

Language:

english

File:

PDF, 2.00 MB

english, 2017

8

Statistical analysis of dislocations and dislocation boundaries from EBSD data

Moussa, C., Bernacki, M., Besnard, R., Bozzolo, N.

Journal:

Ultramicroscopy

Year:

2017

Language:

english

File:

PDF, 3.76 MB

english, 2017

9

Note on in situ (scanning) transmission electron microscopy study of liquid samples

Journal:

Ultramicroscopy

Year:

2017

Language:

english

File:

PDF, 1.27 MB

english, 2017

10

Vacuum scanning capillary photoemission microscopy

Aseyev, S.A., Cherkun, A.P., Mironov, B.N., Petrunin, V.V., Chekalin, S.V.

Journal:

Ultramicroscopy

Year:

2017

Language:

english

File:

PDF, 652 KB

english, 2017

11

Development of compact Cs corrector for desktop electron microscope

Chang, Wei-Yu, Chen, Fu-Rong

Journal:

Ultramicroscopy

Year:

2017

Language:

english

File:

PDF, 1.94 MB

english, 2017

12

Atom probe tomography analysis of SiGe fins embedded in SiO 2 : Facts and artefacts

Melkonyan, D., Fleischmann, C., Arnoldi, L., Demeulemeester, J., Kumar, A., Bogdanowicz, J., Vurpillot, F., Vandervorst, W.

Journal:

Ultramicroscopy

Year:

2017

Language:

english

File:

PDF, 1.12 MB

english, 2017

13

Consequences of the CMR effect on EELS in TEM

Wallisch, Wolfgang, Stöger-Pollach, Michael, Navickas, Edvinas

Journal:

Ultramicroscopy

Year:

2017

Language:

english

File:

PDF, 946 KB

english, 2017

14

Non-contact scanning probe technique for electric field measurements based on nanowire field-effect transistor

Trifonov, A.S., Presnov, D.E., Bozhev, I.V., Evplov, D.A., Desmaris, V., Krupenin, V.A.

Journal:

Ultramicroscopy

Year:

2017

Language:

english

File:

PDF, 3.86 MB

english, 2017

15

Response to the comment by C. Kisielowski, H.A. Calderon, F.R. Chen, S. Helveg, J.R. Jinschek, P. Specht, D. Van Dyck on the article “On the influence of the electron dose-rate on the HRTEM image contrast” by J. Barthel, M. Lentzen, A. Thust, Ultramicroscopy 176 (2017) 37–45

Barthel, Juri, Lentzen, Markus, Thust, Andreas

Journal:

Ultramicroscopy

Year:

2017

Language:

english

File:

PDF, 291 KB

english, 2017

16

Editorial Board

Journal:

Ultramicroscopy

Year:

2017

Language:

english

File:

PDF, 106 KB

english, 2017

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