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MEASUREMENT OF MINORITY-CARRIER LIFETIME AND INTERFACE RECOMBINATION VELOCITIES IN P-I-N DIODES, FROM HIGH FREQUENCY RESPONSE OF A BIPOLAR JFET STRUCTURE
VITALE, G., SPIRITO, P.Volume:
49
Language:
english
Journal:
Le Journal de Physique Colloques
DOI:
10.1051/jphyscol:1988474
Date:
September, 1988
File:
PDF, 749 KB
english, 1988