Similarities of lag phenomena and current collapse in...

Microelectronics Reliability 2017 / 06 Vol. 73

Similarities of lag phenomena and current collapse in field-plate AlGaN/GaN HEMTs with different types of buffer layers

Tsurumaki, Ryouhei, Noda, Naohiro, Horio, Kazushige
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Volume:
73
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.04.019
Date:
June, 2017
File:
PDF, 1.66 MB
english, 2017
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