Thermal impedance measurement of integrated inductors on bulk silicon substrate
Kałuża, M., Więcek, B., De Mey, G., Hatzopoulos, A., Chatziathanasiou, V.Volume:
73
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.04.005
Date:
June, 2017
File:
PDF, 1.34 MB
english, 2017