Random telegraph noise in SiGe HBTs: Reliability analysis...

Microelectronics Reliability 2017 / 06 Vol. 73

Random telegraph noise in SiGe HBTs: Reliability analysis close to SOA limit

Mukherjee, C., Jacquet, T., Chakravorty, A., Zimmer, T., Boeck, J., Aufinger, K., Maneux, C.
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Volume:
73
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.05.001
Date:
June, 2017
File:
PDF, 2.89 MB
english, 2017
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