Consequences of the CMR effect on EELS in TEM

Ultramicroscopy 2017 / 08 Vol. 179

Consequences of the CMR effect on EELS in TEM

Wallisch, Wolfgang, Stöger-Pollach, Michael, Navickas, Edvinas
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Volume:
179
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2017.04.011
Date:
August, 2017
File:
PDF, 946 KB
english, 2017
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