A multiscale analytical correction technique for...

Microelectronics Reliability 2017 / 07 Vol. 74

A multiscale analytical correction technique for two-dimensional thermal models of AlGaN/GaN HEMTs

Azarifar, Mohammad, Donmezer, Nazli
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Volume:
74
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.05.020
Date:
July, 2017
File:
PDF, 854 KB
english, 2017
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