Non-contact scanning probe technique for electric field...

Ultramicroscopy 2017 / 08 Vol. 179

Non-contact scanning probe technique for electric field measurements based on nanowire field-effect transistor

Trifonov, A.S., Presnov, D.E., Bozhev, I.V., Evplov, D.A., Desmaris, V., Krupenin, V.A.
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Volume:
179
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2017.03.030
Date:
August, 2017
File:
PDF, 3.86 MB
english, 2017
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