Effects of electrical stressing in power VDMOSFETs☆

Microelectronics Reliability 2005 / 01 Vol. 45; Iss. 1

Effects of electrical stressing in power VDMOSFETs☆

STOJADINOVIC, N, MANIC, I, DAVIDOVIC, V, DANKOVIC, D, DJORICVELJKOVIC, S, GOLUBOVIC, S, DIMITRIJEV, S
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Volume:
45
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/s0026-2714(04)00378-6
Date:
January, 2005
File:
PDF, 443 KB
english, 2005
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