Abnormal behavior with hump characteristics in current...

Solid-State Electronics 2017 / 11 Vol. 137

Abnormal behavior with hump characteristics in current stressed a-InGaZnO thin film transistors

Kim, Woo-Sic, Cho, Yong-Jung, Lee, Yeol-Hyeong, Park, JeongKi, Kim, GeonTae, Kim, Ohyun
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Volume:
137
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2017.08.001
Date:
November, 2017
File:
PDF, 2.33 MB
english, 2017
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