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BTI mitigation by anti-ageing software patterns
Abbas, Haider Muhi, Halak, Basel, Zwolinski, MarkVolume:
79
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.10.009
Date:
December, 2017
File:
PDF, 1.61 MB
english, 2017